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Electron multiplier for scanning electron mircroscopes

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Patent

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Electron optic column and scanning electron microscope

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Patent

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Electron optical measurement apparatus

Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Patent

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Electron probe microanalyzer

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Patent

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Electron probe microanalyzer and X-ray analysis using same

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Patent

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Electron probe microanalyzer having wavelength-dispersive x-ray

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Patent

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Electron radiography

Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Reexamination Certificate

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Electron scanning apparatus

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
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Electron scatter in a thin membrane to eliminate detector...

Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Reexamination Certificate

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Electron spectroscopy employing controlled surface charging

Radiant energy – Inspection of solids or liquids by charged particles
Reexamination Certificate

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Electron spin analyzer

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Electron storage source for electron beam testers

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Patent

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Electron-beam biprism

Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Patent

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Electron-beam device and detector system

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Electron-beam device and detector system

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Electron-beam testing of semiconductor wafers

Radiant energy – Inspection of solids or liquids by charged particles – Methods
Patent

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Electron-beam writing device and electron-beam writing method

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Electron-microscopic image viewing system

Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Patent

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Electron-optical imaging system having controllable elements

Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Patent

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Electron-optical system and inspection method using the same

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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