Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Reexamination Certificate
2005-05-17
2005-05-17
Nguyen, Kiet T. (Department: 2881)
Radiant energy
Inspection of solids or liquids by charged particles
Electron microscope type
C250S3960ML
Reexamination Certificate
active
06894278
ABSTRACT:
A system capable of performing radiography using a beam of electrons. Diffuser means receive a beam of electrons and diffuse the electrons before they enter first matching quadrupoles where the diffused electrons are focused prior to the diffused electrons entering an object. First imaging quadrupoles receive the focused diffused electrons after the focused diffused electrons have been scattered by the object for focusing the scattered electrons. Collimator means receive the scattered electrons and remove scattered electrons that have scattered to large angles. Second imaging quadrupoles receive the collimated scattered electrons and refocus the collimated scattered electrons and map the focused collimated scattered electrons to transverse locations on an image plane representative of the electrons' positions in the object.
REFERENCES:
patent: 4608491 (1986-08-01), Kokubo
Merrill Frank E.
Morris Christopher
Nguyen Kiet T.
The Regents of the University of California
Wyrick Milton D.
LandOfFree
Electron radiography does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electron radiography, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electron radiography will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3462652