Electron probe microanalyzer having wavelength-dispersive x-ray

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type

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250306, 250397, 378 45, 378 46, 378 53, 378 88, G01N 2304

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active

049888722

ABSTRACT:
An electron probe microanalyzer equipped with a wavelength-dispersive x-ray spectrometer and also with an energy-dispersive x-ray spectrometer. X-rays emanating from the same sample region are detected by these two spectrometers, and spectra are created from the detected x-rays. Cursors which can be moved at will are superimposed on the spectra. One of the cursors is moved in relation to the other. That is, when one cursor is moved into the position of a desired wavelength or energy, the other is moved into the position of the corresponding energy or wavelength. The use of the cursors enables one to precisely and easily find the existence of a certain element in the sample region from the spectra obtained by the two x-ray spectrometers.

REFERENCES:
patent: 3204095 (1965-08-01), Watanabe
patent: 3235727 (1966-02-01), Shapiro
patent: 3333100 (1967-07-01), Cilyo
patent: 3514599 (1970-05-01), Campbell
patent: 3694635 (1972-09-01), Hoetzel et al.
patent: 3914605 (1975-10-01), Hara
patent: 3942005 (1976-03-01), Watanabe
patent: 4219731 (1980-08-01), Migitaka et al.
patent: 4253154 (1981-02-01), Russ et al.
patent: 4288692 (1981-09-01), Schamber et al.
patent: 4331872 (1982-05-01), Saga et al.
patent: 4426577 (1984-01-01), Koite et al.
patent: 4724320 (1988-02-01), Ino et al.
patent: 4777364 (1988-10-01), Sartore
patent: 4857731 (1989-08-01), Tagata
patent: 4885465 (1989-12-01), Nagasuka et al.
"X-Ray Fluorescence Analysis", McGraw-Hill Encyclopedia of Science and Technology, vol. 14, pp. 658-662.
"Electron Probe Microanalysis in Health Research", McGraw-Hill Yearbook of Science and Technology 1979 Review 1980 Review, Richard J. Roman, Claude Lechene, pp. 53-61.

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