Circuit pattern inspecting device and method and circuit pattern
Circuit pattern inspection method and its apparatus
Circuit scanning device and method
Coaxial charged particle energy analyzer
Collection of secondary electrons through the objective lens...
Collimator for high takeoff angle energy dispersive spectroscopy
Color synthesizing scanning electron microscope
Color-coded mapping system and method for identifying elements i
Column for charged particle beam device
Compact scanning electron microscope
Compact, high collection efficiency scintillator for...
Compact, integrated electron beam imaging system
Composite charge particle beam apparatus
Conductive transparent probe and probe control apparatus
Conical baffle for reducing charging drift in a particle beam sy
Converting scanning electron microscopes
Corpuscular beam device
Correction method of scanning electron microscope
Crystal phase identification
Defect inspection and charged particle beam apparatus