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Method for determining the thickness of an optical sample

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method for dimensional weighing with optics

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method for estimating durability of optical member against excim

Optics: measuring and testing – By configuration comparison
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Method for evaluating epitaxial layers and test pattern for proc

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method for film thickness and refractive index determination

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method for identifying order skipping in spectroreflective film

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method for imaging printed circuit board component leads

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method for inspecting electronic devices mounted on a circuit bo

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method for inspecting filled state of via-holes filled with fill

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method for inspecting stripped condition of electric wire

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method for judging printing sheets

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method for measuring a physical quantity providing digital data

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method for measuring a thickness of a printed circuit board

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method for measuring film thickness

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method for measuring shape parameters of yarn

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method for measuring thickness of films

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method for normalizing the detection signals of magnified images

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method for sensing complete removal of oxide layer from substrat

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method for sensing the pattern side of microcircuit chips

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method for testing a photomask

Optics: measuring and testing – By configuration comparison – With object being compared and light beam moved relative to...
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