Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent
1988-02-25
1989-12-05
McGraw, Vincent P.
Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
356387, 2504591, G01B 1102
Patent
active
048848905
ABSTRACT:
A feedback method, or automatic gain control circuit, for an image photosensor at the focal plane of an optical system for very narrow linewidth measurements of images having varying intensities such as fluorescing photoresist coated lines. The feedback method includes the steps of measuring the instantaneous intensities of the entire optical beam of radiation with a photodetector and applying the output therefrom to the photosensor to thus normalize its output signal.
REFERENCES:
patent: 3643101 (1972-02-01), Shipp et al.
patent: 4050821 (1977-09-01), Cuthbert et al.
patent: 4373817 (1983-02-01), Coates
"Critical-Dimension Control in the Late Eighties", Toro-Lira et al., Microelectronic Manufacturing and Testing, vol. 8, No. 1, 1-1985, 1-14.
"Evaluating Optical Linewidth Measurement Systems", 7-1986.
Castle Linval B.
McGraw Vincent P.
Nanometrics Incorporated
Turner S. A.
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