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Marker structure, mask pattern, alignment method and...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Mask aligner having a photo-mask setting device

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Mask alignment system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Mask alignment system for components with extremely sensitive su

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Mask-to-wafer alignment utilizing zone plates

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Measurement of overlay using diffraction gratings when...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Measuring method and exposure apparatus

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Method and apparatus for aligning a lenticular overlay with a le

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Method and apparatus for aligning an ophthalmic lens during a bl

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Method and apparatus for aligning visual images with visual disp

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Method and apparatus for alignment

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Method and apparatus for alignment and bonding

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Method and apparatus for alignment and exposure

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Method and apparatus for angular-resolved spectroscopic...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Method and apparatus for automatic adjustment of electron optics

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Method and apparatus for automatic alignment

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Method and apparatus for detecting diversion

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Method and apparatus for detecting edges under an opaque layer

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Method and apparatus for detecting relative positional...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Method and apparatus for detecting the position of a substrate h

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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