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Reducing asymmetrically deposited film induced registration...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Reduction exposure apparatus with correction for alignment light

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Reduction projection aligner system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Reduction projection system alignment method and apparatus

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Reduction projection type aligner

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Reflective alignment grating

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Register-measuring system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Registration method and apparatus therefor

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Registration of sheet materials using statistical targets...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Registration target design for managing both reticle grid...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Reticle for a reduced projection exposure apparatus

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Reticle overlay correction

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Reticle pre-alignment apparatus and method thereof

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Rotational deviation detecting method and system using a periodi

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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