Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent
1995-11-30
1998-06-09
Hantis, K.
Optics: measuring and testing
By alignment in lateral direction
With registration indicia
G01B 1100
Patent
active
057643660
ABSTRACT:
A method and apparatus aligns device components based on an analysis of an image of features of the components to be aligned. The image is analyzed for deviation in component alignment, and a signal, based on the deviation, is sent to a positioning apparatus to adjust the position of the components relative to each other. The image of the components is advantageously a top view which permits measuring deviations in alignment of features on the top surfaces of components. The components are advantageously bonded together after alignment, and the alignment accuracy of the bonded components is checked.
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Nguyen Hung Ngoc
Watkins Laurence Shrapnell
Bartholomew Steven R.
Hantis K.
Lucent Technologies - Inc.
Olson Katharyn E.
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