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Object extracting method

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Observation device and an aligner using same

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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On-axix mask and wafer alignment system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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One-dimensional active alignment of optical or opto-electronic d

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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One-dimensional active alignment of optical or opto-electronic d

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Optical alignment detection apparatus

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Optical alignment method using arbitrary geometric figures

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Optical alignment system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Optical device for alignment in a projection exposure apparatus

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Optical device for the alignment of two superimposed objects

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Optical gratings, lithography tools including such optical...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Optical metrology tool and method of using same

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Optical metrology tool and method of using same

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Optical microlithography apparatus with a local alignment system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Optical path length compensating optical system in an alignment

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Optical self-alignment system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Overlay alignment mark design

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Overlay alignment mark design

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Overlay alignment mark design

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Overlay alignment mark design

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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