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Testing and burn-in of IC chips using radio frequency transmissi

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Testing and burn-in of IC chips using radio frequency transmissi

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Testing and burn-in of IC chips using radio frequency...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Testing and debugging tool for network applications

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Testing and repair methodology for memories having redundancy

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Testing apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Testing apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Testing apparatus and a testing method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Testing apparatus and method for preventing a disk unit from...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Testing apparatus and testing method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Testing apparatus and testing method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Testing apparatus and testing method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Testing apparatus and testing method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Testing apparatus and testing method for an integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Testing apparatus and testing method for an integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Testing apparatus for semiconductor memory device

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Testing board for semiconductor memory, method of testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Testing board for semiconductor memory, method of testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Testing circuit split between tiers of through silicon...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Testing CMOS CAM with redundancy

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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