LandOfFree - US Patents - Listing for Error detection/correction and fault detection/recovery

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Test mode matrix circuit for an embedded microprocessor core

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Patent

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Test mode programmable reset for a watchdog timer

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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Test mode setup circuit for microcontroller unit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Test mode soft reset circuitry and methods

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Test output compaction for responses with unknown values

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Test output compaction using response shaper

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Test output compaction with improved blocking of unknown values

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Test pattern compression for an integrated circuit test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Test pattern compression for an integrated circuit test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Test pattern compression for an integrated circuit test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Test pattern compression for an integrated circuit test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Test pattern compression method, apparatus, system and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Test pattern compression with pattern-independent...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Test pattern conversion apparatus and conversion method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Test pattern generating apparatus, communication device and simu

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Patent

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Test pattern generating apparatus, method for automatically...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Test pattern generating apparatus, method for automatically...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Test pattern generating method and apparatus and storing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Test pattern generating method and test pattern generating syste

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Patent

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Test pattern generation

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

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