Test pattern generating apparatus, communication device and simu

Details Test pattern generating apparatus, communication device and simu Test pattern generating apparatus, communication device and simu

1998-05-05

2000-07-11

Nguyen, Hoa T.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

G01R 3128

Patent

active

060888245

ABSTRACT:
A test pattern generating apparatus generates a test pattern for evaluating whether or not source data and a bit synchronous clock signal SCK are transmitted normally through a bus connecting a plurality of terminal units for transmitting and receiving source data. A test pattern generating circuit 33 generates predetermined test pattern data which are predetermined as the test pattern, based on the bit synchronous clock signal and a frame synchronous clock signal LRCK and outputs the test pattern data, bit synchronous clock signal and frame synchronous clock signal to the bus.

REFERENCES:
patent: 4247941 (1981-01-01), Raymond
patent: 5383195 (1995-01-01), Spence et al.
patent: 5909448 (1999-06-01), Takahashi

Affiliated with

Also associated with

Rating

Test pattern generating apparatus, communication device and simu does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test pattern generating apparatus, communication device and simu, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test pattern generating apparatus, communication device and simu will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-553298