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Semiconductor memory device and method for driving the same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Semiconductor memory device and method for executing shift...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor memory device and method for testing memory...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory device and method of controlling the same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Semiconductor memory device and method of performing a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory device and method of testing same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory device and method of testing same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
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Semiconductor memory device and method of testing the same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory device and methods thereof

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory device and parallel bit test method...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor memory device and redundant address selection meth

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
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Semiconductor memory device and refresh period controlling...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error count or rate
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Semiconductor memory device and sales processor having the same

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor memory device and semiconductor memory device...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
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Semiconductor memory device and signal processing system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Semiconductor memory device and signal processing system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Semiconductor memory device and test method of the same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory device and test pattern data generating...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor memory device and testing method of the same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory device and testing system and testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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