Semiconductor memory device and method of testing the same

Details Semiconductor memory device and method of testing the same Semiconductor memory device and method of testing the same

2006-02-06

2009-10-20

Ellis, Kevin L (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S718000, C714S724000, C714S733000, C714S738000, C365S200000, C365S201000

Reexamination Certificate

active

07607055

ABSTRACT:
A semiconductor memory device includes at least one first built in self test (BIST) circuit configured to generate test pattern data, and at least one second BIST circuit configured to receive the test pattern data as received test pattern data and compare the received test pattern data to the test pattern data.

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patent: 08-329698 (1996-12-01), None
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English language abstract of Korean Publication No. 1999-69337.
English language abstract of Japanese Publication No. 08-329698.
English language abstract of Japanese Publication No. 2004-093421.

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