Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2007-03-30
2010-02-02
Kerveros, James C (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
Reexamination Certificate
active
07657800
ABSTRACT:
A semiconductor memory device and method directed to performing a memory operation in a semiconductor memory device, which include receiving data and a data masking signal corresponding to a portion of the received data configured to be written into memory in response to a write command and the data masking signal configured to block the at least a portion of the received data from being written into the memory, and further configuring different timing parameters of the received data and the data masking signal for executing the write command without writing the at least a portion of the received data into the memory.
REFERENCES:
patent: 6188639 (2001-02-01), Sakakibara
patent: 6192429 (2001-02-01), Jeong et al.
patent: 6252804 (2001-06-01), Tomita
patent: 6411564 (2002-06-01), Ikeda
Kang Sang-Seok
Lim Jong-Hyoung
Harness & Dickey & Pierce P.L.C.
Kerveros James C
Samsung Electronics Co,. Ltd.
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