4. Error detection/correction and fault detection/recovery
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Semiconductor integrated circuit and testing method thereof

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit and testing method thereof

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit and testing method thereof

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit and the same checking method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
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Semiconductor integrated circuit apparatus and control...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit capable of testing with...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit compensating variations of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit detecting glitch noise and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
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Semiconductor integrated circuit device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit device and device for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit device and error checking...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
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Semiconductor integrated circuit device and inspection...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit device and its test method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit device and method for monitorin

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit device and method for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit device and method for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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