Semiconductor integrated circuit and testing method thereof

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S702000

Reexamination Certificate

active

07426663

ABSTRACT:
There are provided a plurality of bridge circuits which convert the test data information from a common test bus connected to a plurality of memories of different access data widths and address decode logics to the inherent access data widths of each memory and also convert the test address information from the common test bus to the inherent bit format of each memory to supply the result to the corresponding memory. The test address information is supplied in parallel from the common test bus to a plurality of memories to realize the parallel tests. Accordingly, the test data information can be supplied in parallel to a plurality of memories of different data widths and the address scan direction in the respective memories for the test address information can be uniformed to the particular direction depending on the inherent bit format. Thereby, the memory test efficiency by the match pattern for a plurality of on-chip memories can be improved.

REFERENCES:
patent: 4484303 (1984-11-01), Provanzano et al.
patent: 5040150 (1991-08-01), Naitoh et al.
patent: 6336088 (2002-01-01), Bauman et al.
patent: 6587979 (2003-07-01), Kraus et al.
patent: 7222272 (2007-05-01), Takazawa et al.
patent: 11-250698 (1998-03-01), None
patent: 2000-111618 (1998-09-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor integrated circuit and testing method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor integrated circuit and testing method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit and testing method thereof will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3967963

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.