Semiconductor integrated circuit and the same checking method

Details Semiconductor integrated circuit and the same checking method Semiconductor integrated circuit and the same checking method

2006-12-27

2010-02-02

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Replacement of memory spare location, portion, or segment

C714S711000, C714S718000, C714S723000, C714S736000, C714S799000, C714S807000, C714S808000, C714S005110, C714S006130, C714S006130, C714S042000, C324S763010, C365S201000

Reexamination Certificate

active

07657798

ABSTRACT:
A semiconductor integrated circuit has a cell array, a redundancy cell capable of replacing a defective cell, a redundancy control circuit, a plurality of first fuses, a plurality of second fuses, a plurality of third fuses, a first shift register configured to hold states of the plurality of first fuses, a second shift register configured to be connected in cascade to the first shift register and to hold states of the plurality of second fuses, a third shift register configured to be connected to the first and second shift registers in cascade and to hold states of the plurality of third fuses, a CRC remainder calculator configured to sequentially input information held by the first to third shift registers to a CRC generating equation to calculate a remainder obtained by division, and a CRC determination part that outputs information indicative of whether the first to third fuses are correctly programmed.

REFERENCES:
patent: 2002/0062458 (2002-05-01), Maeno
patent: 2002/0125907 (2002-09-01), Kurtulik et al.
patent: 2005/0076274 (2005-04-01), Nagai et al.
patent: 64-23465 (1989-01-01), None
patent: 7-272411 (1995-10-01), None

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