4. Error detection/correction and fault detection/recovery
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Semiconductor device with test interface

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor device with test mode

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor device, and the method of testing or making of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor device, method of testing the same and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor device, test board for testing the same, and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor device, unique ID of semiconductor device and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor devices having multiple memories

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor devices including test circuits and related...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor disk device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Semiconductor IC incorporating a co-debugging function and...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor inspection method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Semiconductor integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction
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Semiconductor integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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