Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-09-26
2006-09-26
Tu, Christine T. (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S739000, C324S765010
Reexamination Certificate
active
07114110
ABSTRACT:
A signature circuit, i.e., a random-number generating circuit, is provided in a memory test apparatus. Also, a signature circuit is provided in each of devices-under-test. This configuration allows the large number of semiconductor integrated-circuit devices to be tested at one time with a high efficiency. This condition realizes a tremendous reduction in the test cost.
REFERENCES:
patent: 6034905 (2000-03-01), Suzuki et al.
patent: 6097206 (2000-08-01), Takano
patent: 6801050 (2004-10-01), Takechi et al.
patent: 08-107185 (1998-04-01), None
patent: 10-090362 (1998-04-01), None
patent: 2000-090693 (2000-03-01), None
patent: 2000-97998 (2000-04-01), None
patent: 2001-285616 (2001-09-01), None
H. Koike et al., “A Bist Scheme Using Microprogram ROM for Large Capacity Memories”, International Test Conference Paper 36.1, pp. 815-822, 1990.
B. Cockbur, et al., “Synthesized Transparent BIST for Detecting Scrambled Pattern-Sensitive Faults in RAMs”, International Test Conference, Paper 2.2, pp. 23-32, 1995.
Ternullo, Jr., et al., “Deterministic Self-Test of a High-speed Embedded Memory and Logic Processor Subsystem”, International Test Conference, Paper 2.3, pp. 33-44, 1995.
Hirano Katsunori
Kikuchi Shuji
Sonoda Yuji
Toba Tadanobu
Wada Takeshi
Antonelli, Terry Stout and Kraus, LLP.
Renesas Technology Corp.
Tu Christine T.
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