Semiconductor integrated circuit

Details Semiconductor integrated circuit Semiconductor integrated circuit

2008-03-13

2010-12-14

Kerveros, James C (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Skew detection correction

C714S744000

Reexamination Certificate

active

07853836

ABSTRACT:
A semiconductor integrated circuit includes a clock generator which generates a first clock, a test data generator which modulates a phase of the first clock, and generates test data to which jitter is added by using the modulated clock, a data extractor which samples the test data and extracts recovery data, and a detector which detects an error of the recovery data.

REFERENCES:
patent: 5793822 (1998-08-01), Anderson et al.
patent: 7142623 (2006-11-01), Sorna
patent: 7558991 (2009-07-01), Mattes et al.
patent: 2007/0113119 (2007-05-01), Hafed et al.
patent: 2009/0086801 (2009-04-01), Liu et al.
patent: 2006-025114 (2006-01-01), None

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