Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-07-10
2009-06-30
Ton, David (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S030000
Reexamination Certificate
active
07555686
ABSTRACT:
Provided are a semiconductor device, a test board, and a test system and method for testing a semiconductor device. The semiconductor device includes an input terminal to which test pattern data is serially input at a first speed and an output terminal which one-to-one corresponds to the input terminal and serially outputs the test pattern data to the outside at a second speed that is different from the first speed.
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Mills & Onello LLP
Samsung Electronics Co,. Ltd.
Ton David
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