Semiconductor device with test interface

Details Semiconductor device with test interface Semiconductor device with test interface

2006-08-18

2009-12-15

Ellis, Kevin L (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S731000

Reexamination Certificate

active

07634700

ABSTRACT:
A semiconductor device with test interface, as well as to a method for operating a semiconductor device is disclosed. In one embodiment, in a test operating mode, the semiconductor device is, via a first pin, supplied with a work cycle signal synchronized with a test environment and, via at least one second pin, with test data. In accordance with a first embodiment it is suggested, so as to reduce the number of pins, that the work cycle signal is simultaneously used as test data clock signal.

REFERENCES:
patent: 5369377 (1994-11-01), Benhamida
patent: 5434804 (1995-07-01), Bock et al.
patent: 6195775 (2001-02-01), Douskey et al.
patent: 7055045 (2006-05-01), Gaboriau et al.
patent: 7284174 (2007-10-01), Dubey
patent: 61-148378 (1986-07-01), None
patent: 62-022085 (1987-01-01), None
patent: 03-265203 (1991-11-01), None
patent: 2005-140759 (2005-06-01), None
“IEEE Standard Test Access Port and Boundry-Scan Architecture”, Test Technology Standards Committee of the IEEE Computer Society, IEEE Std. 1149.1-1990.
“TC1796-32-Bit Single-Chip Microcontroller Volume 1 (of 2): System Units” Infineon Technologies User Manual, V1.0, Jun. 2005.
“Japanese Office Action mailed Jun. 9, 2009”.

Affiliated with

Also associated with

Rating

Semiconductor device with test interface does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device with test interface, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device with test interface will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4130371