Semiconductor integrated circuit

Details Semiconductor integrated circuit Semiconductor integrated circuit

2011-05-17

2011-05-17

Gaffin, Jeffrey A (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S727000, C714S729000

Reexamination Certificate

active

07945829

ABSTRACT:
[PROBLEMS] To provide a semiconductor integrated circuit by which what has been referred to as two-pattern test is made possible without greatly increasing an occupying area. [MEANS FOR SOLVING PROBLEMS] The semiconductor integrated circuit is provided with a plurality of flip-flop circuits and selectors corresponding to each flip-flop circuit. Each flip-flop circuit is provided with a master latch and a slave latch connected to the master latch. The selector is electrically connected with the master latch of the flip-flop circuit to which the selector corresponds, and is also connected with the master latch of the flip-flop circuit other than the one to which the selector corresponds.

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