LandOfFree - US Patents - Listing for Error detection/correction and fault detection/recovery

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Semiconductor device tester for measuring skew between...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction

Reexamination Certificate

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Semiconductor device testing

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device testing apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device testing apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Patent

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Semiconductor device testing apparatus and method for testing me

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Patent

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Semiconductor device testing apparatus and signal output...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device testing apparatus capable of high speed tes

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Patent

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Semiconductor device testing apparatus, system, and method...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Semiconductor device to improve data retention...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Semiconductor device to improve data retention...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Semiconductor device with boundary scanning circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device with embedded memory cells

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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Semiconductor device with logic rewriting and security...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction

Reexamination Certificate

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Semiconductor device with memory and method for memory test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Semiconductor device with memory and method for memory test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Semiconductor device with self-test circuits and test method...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device with speed binning test circuit and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device with termination resistor circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device with termination resistor circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device with test circuit and test method of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

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