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Semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction
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Semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Semiconductor device adapted for forming multiple scan chains

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor device and boot method for the same

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor device and inspection method of semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor device and inspection method of semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor device and method and apparatus for testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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