Semiconductor device and inspection method of semiconductor...

Details Semiconductor device and inspection method of semiconductor... Semiconductor device and inspection method of semiconductor...

2006-07-28

2010-02-23

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S733000

Reexamination Certificate

active

07669094

ABSTRACT:
The invention provides an inspection method of a semiconductor device which receives a test program wirelessly. As an inspection method of the semiconductor device, a test program is transmitted as a communication signal for every test. By transmitting a test program as a communication signal wirelessly in the case of an operation test, test contents are changed as required. As a result, a test program can be easily changed and an inspection circuit or the like is not required. In this manner, manufacturing cost of a wireless chip can be reduced.

REFERENCES:
patent: 6509217 (2003-01-01), Reddy
patent: 7249302 (2007-07-01), Maltseff et al.
patent: 7395474 (2008-07-01), Maltseff et al.
patent: 7463140 (2008-12-01), Schmidt
patent: 2008/0093454 (2008-04-01), Yamazaki et al.
patent: 2001-307047 (2001-11-01), None
patent: 2003-057300 (2003-02-01), None
patent: 2003-060047 (2003-02-01), None

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