Semiconductor device

Details Semiconductor device Semiconductor device

2008-11-17

2010-11-30

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S723000

Reexamination Certificate

active

07844872

ABSTRACT:
A semiconductor device capable of reducing a memory area of a test circuit required for storing fail-information is provided. In the test circuit, for determining right/wrong of information obtained by memory access, specific fail-information among pieces of fail-information sequentially obtained in response to wrong-determination result is held in a first memory section; and differences in serial two pieces of fail-information sequentially continuing from the specific fail-information are held in a second memory section. The test circuit, when it obtains differences based on pieces of fail-information sequentially obtained with a wrong-determination result at the time of holding the specific fail-information as a base point, sequentially adds subsequent differences to the specific fail-information to decompress subsequent pieces of fail-information.

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