Testing of ECC memories

Testing of electronic circuits

Testing of high speed DDR interface using single clock edge...

Testing of integrated circuit devices

Testing of integrated circuit devices

Testing of integrated circuit receivers

Testing of integrated circuits

Testing of integrated circuits using boundary scan

Testing of modules operating with different characteristics...

Testing of replicated components of electronic device

Testing propagation delay of a shift register using a ring...

Testing regularly structured logic circuits in integrated...

Testing replicated sub-systems in a yield-enhancing...

Testing self-repairing memory of a device

Testing self-repairing memory of a device

Testing synchronization circuitry using digital simulation

Testing system and method of using same

Testing system and methods with protocol pattern injection...

Testing system for a device under test

Testing system for circuit board self-test