Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2007-12-11
2007-12-11
Kerveros, James C (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S733000, C714S763000
Reexamination Certificate
active
10063495
ABSTRACT:
A BIST system that utilizes ECC to correct single bit errors in a given memory word at a given address, the ECC having a maximum number of bit errors it can correct in the given memory word. A first set of gates is coupled to an array of memory cells that stores a plurality of memory words, each at a given address. The first set of gates provides bit outputs indicative of errors in a given memory word while the given memory word is under test. A circuit coupled to respective outputs of the first set of gates determines if a number of errors in the memory word under test exceeds the maximum number of errors correctable by the ECC.
REFERENCES:
patent: 4335459 (1982-06-01), Miller
patent: 4891811 (1990-01-01), Ash et al.
patent: 5134616 (1992-07-01), Barth, Jr. et al.
patent: 5511029 (1996-04-01), Sawada et al.
patent: 5535164 (1996-07-01), Adams et al.
patent: 5561671 (1996-10-01), Akiyama
patent: 5587950 (1996-12-01), Sawada et al.
patent: 5617531 (1997-04-01), Crouch et al.
patent: 5689466 (1997-11-01), Qureshi
patent: 5831989 (1998-11-01), Fujisaki
patent: 5907561 (1999-05-01), Blish, II et al.
patent: 6026505 (2000-02-01), Hedberg et al.
patent: 6070256 (2000-05-01), Wu et al.
patent: 6118711 (2000-09-01), Merritt
patent: 6205564 (2001-03-01), Kim et al.
patent: 6792567 (2004-09-01), Laurent
Technique of Using Compressed Bit-Map for Memory Utilization, Research Disclosure, Apr. 1991, No. 324, Disclosure 32412.
“Enhanced Memory Addressing Diagnostics for Intermediate Systems”, IBM Tech. Discl. Bull.1, vol. 34, No. 5, Oct. 1991, pp. 323-325.
Adams R. Dean
Salem Gerard M.
von Reyn Timothy J.
Harding W. Riyon
International Business Machines - Corporation
Kerveros James C
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