Testing self-repairing memory of a device

Details Testing self-repairing memory of a device Testing self-repairing memory of a device

2005-10-20

2009-02-10

Chung, Phung M (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S733000, C714S734000

Reexamination Certificate

active

07490276

ABSTRACT:
Testing one or more memories of a device includes receiving one or more first repair records from one or more built-in self-testers of a device having one or more memories. A built-in self-tester is associated with a memory, and a first repair record describes a first repair at a memory. A first repair signature corresponding to the first repairs at the memories is generated from the first repair records, and then is recorded. One or more second repair records are received from the built-in self-testers, where a second repair record describes a second repair at a memory. A second repair signature corresponding to the second repairs at the memories is generated from the second repair records. The second repair signature is compared with the first repair signature. The device is evaluated in response to the comparison.

REFERENCES:
patent: 5568437 (1996-10-01), Jamal
patent: 5617531 (1997-04-01), Crouch et al.
patent: 5936900 (1999-08-01), Hii et al.
patent: 5991898 (1999-11-01), Rajski et al.
patent: 6000048 (1999-12-01), Krishna et al.
patent: 6085334 (2000-07-01), Giles et al.
patent: 6154861 (2000-11-01), Harward
patent: 6158036 (2000-12-01), Kwak
patent: 6226766 (2001-05-01), Harward
patent: 6246619 (2001-06-01), Ematrudo et al.
patent: 6256237 (2001-07-01), Ho et al.
patent: 6285620 (2001-09-01), Ho et al.
patent: 6436741 (2002-08-01), Sato et al.
patent: 6574763 (2003-06-01), Bertin et al.
patent: 6728901 (2004-04-01), Rajski et al.
patent: 6754117 (2004-06-01), Jeddeloh
patent: 7127647 (2006-10-01), Zorian et al.
patent: 7149921 (2006-12-01), Zorian et al.
patent: 7149924 (2006-12-01), Zorian et al.
patent: 7237154 (2007-06-01), Zorian

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