Testing system and method of using same

Details Testing system and method of using same Testing system and method of using same

2001-08-20

2008-07-15

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S733000

Reexamination Certificate

active

07401271

ABSTRACT:
A testing system (and method of using same) for testing a system-under-test (SUT) are provided. One embodiment of the testing system includes first, second, and third logic sections. The third logic section selectively couples either the first logic section or the second logic section to the SUT, based upon two control signals transmitted to the third logic section. One of the control signals is transmitted from a source external to the SUT, first logic section, second logic section, and third logic section. The other control signal is transmitted from the first logic section. When the third logic section couples the first logic section to the SUT, the first logic section may transmit one or more test-related signals to the SUT. When the third logic section couples the second logic section to the SUT, the second logic section may transmit one or more other signals to the SUT.

REFERENCES:
patent: 5325367 (1994-06-01), Dekker et al.
patent: 5355369 (1994-10-01), Greenberger et al.
patent: 5572712 (1996-11-01), Jamal
patent: 5987632 (1999-11-01), Irrinki et al.
patent: 6021512 (2000-02-01), Lattimore et al.
patent: 6169418 (2001-01-01), Wagner
patent: 6370661 (2002-04-01), Miner
patent: 6457141 (2002-09-01), Kim et al.
patent: 6539503 (2003-03-01), Walker
patent: 6658611 (2003-12-01), Jun
patent: 6966017 (2005-11-01), Evans

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