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Squence control circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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SRAM that can be clocked on either clock phase

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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SRAM-compatible memory for correcting invalid output data...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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SSD test systems and methods

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Stability test for silicon on insulator SRAM memory cells...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Star-I: scalable tester architecture with I-cached SIMD technolo

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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STAR-I: scalable tester architecture with I-cached SIMD technolo

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Start/stop circuit for performance counter

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Start/stop circuit for performance counter

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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State metric memory of viterbi decoder and its decoding method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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State relaxation based subsequence removal method for fast stati

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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States encoding in multi-bit flash cells for optimizing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Static random access memory (SRAM) unit and method for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Static semiconductor memory device having test mode

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Static test sequence compaction using two-phase restoration and

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Static timing analysis approach for multi-clock domain designs

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Static viterbi detector for channels utilizing a code having...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Statistical decision system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Statistical yield of a system-on-a-chip

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Statistics signature generation and analysis

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
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