Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2011-01-18
2011-01-18
Chung, Phung M (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C365S185330
Reexamination Certificate
active
07873885
ABSTRACT:
Solid state drive (SSD) testing processes and methods are disclosed. In one embodiment, the SSD testing process comprises: specifying a set of test parameters of firmware, operating system and flash memory for a plurality of SSDs under test (DUTs) in an SSD test system, the set of test parameters includes a model number, a serial number, a desired defective or bad block ratio and a size of the firmware, wherein the model and serial number are configured onto each of the DUTs; performing an initialization test of all of the DUTs based on the specified test parameters to determine a pre-qualified group of the DUTs that passed the initialization test; conducting at least one level of burn-in test for each SSD in the pre-qualified group; conducting at least one level of burn-in test for each SSD in the pre-qualified group; and assigning a quality grade to said each SSD based on which level of the at least one level of burn-in test said each SSD has been tested and passed, wherein the quality grade includes a commercial grade SSD made using at least one Multi-Level Cell flash memory.
REFERENCES:
patent: 5581510 (1996-12-01), Furusho et al.
patent: 7197662 (2007-03-01), Bullen et al.
patent: 7788553 (2010-08-01), Chow et al.
Lee Charles C.
Ma Abraham Chih-Kang
Shin Myeong-Jin
Yu I-Kang
Chu Roger H.
Chung Phung M
Super Talent Electronics Inc.
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