Statistical yield of a system-on-a-chip

Details Statistical yield of a system-on-a-chip Statistical yield of a system-on-a-chip

2011-03-08

2011-03-08

Tu, Christine T (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S745000, C365S200000, C365S201000

Reexamination Certificate

active

07904766

ABSTRACT:
Improving statistical yield of a system-on-a-chip. The system-on-a-chip includes several memory systems. Each memory system includes a large number of memories. The memories are tested to identify any faulty memories. One or more margins of the faulty memories are then varied and the memories are then tested again.

REFERENCES:
patent: 5034923 (1991-07-01), Kuo et al.
patent: 5337318 (1994-08-01), Tsukakoshi et al.
patent: 5488578 (1996-01-01), Yamada
patent: 6453433 (2002-09-01), Vollrath

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