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Selected: M

Memory based phase locked loop

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Memory BISR architecture for a slice

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Memory block quality identification in a memory device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Memory board with self-testing capability

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Memory built-in self repair (MBISR) circuits/devices and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
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Memory built-in self test circuit with full error mapping...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Memory built-in self test engine apparatus and method with...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Memory bus checking procedure

Error detection/correction and fault detection/recovery – Pulse or data error handling – Transmission facility testing
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Memory bus checking procedure

Error detection/correction and fault detection/recovery – Pulse or data error handling – Transmission facility testing
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Memory bypass with support for path delay test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Memory card and memory controller

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Memory card and memory controller

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Memory card and memory controller

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Memory card and memory controller

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Memory card design with parity and ECC for non-parity and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
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Memory card with error correction scheme requiring reducing memo

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Memory cell circuit for executing specific tests on memory cells

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Memory cell programming

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Memory cell programming

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Memory cell supply voltage control based on error detection

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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