MB810 encoder/decoder, dual mode encoder/decoder, and MB810...

Means for testing dynamic integrated circuits

Means scanning scan path parts sequentially and capturing...

Means scanning scan path parts sequentially and capturing...

Measurement circuit and method for serially merging...

Measurement of health statistics for a high-speed interface

Measuring an error rate in a communication link

Measuring bridge-fault coverage for test patterns within...

Measuring microprocessor susceptibility to internal noise...

Measuring propagation delays of programmable logic devices

Mechanism and display for boundary-scan debugging information

Mechanism for decoding linearly-shifted codes to facilitate...

Mechanism for enabling compliance with the IEEE standard...

Mechanism for enabling compliance with the IEEE standard...

Mechanism for implementing redundancy to mask failing SRAM

Mechanism for implementing redundancy to mask failing SRAM

Mechanism for turbo decoding when CRC for partial blocks is...

Mechanism handling race conditions in FRC-enabled processors

Mechanism to enhance observability of integrated circuit...

Mechanism to provide test access to third-party macro...