Non-binary address generation for ABIST

Details Non-binary address generation for ABIST Non-binary address generation for ABIST

2006-07-11

2006-07-11

Decady, Albert (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S718000, C714S733000, C714S702000, C365S201000

Reexamination Certificate

active

07076710

ABSTRACT:
Method and system for testing a memory array having a non-uniform binary address space. The test system includes a test engine for generating addresses for the memory array and for generating and applying data patterns to the memory array. The test engine has an address generator including a series combination of a linear register and a binary counter for generating the non-uniform address.

REFERENCES:
patent: 5222109 (1993-06-01), Pricer
patent: 5633877 (1997-05-01), Shephard et al.
patent: 6829181 (2004-12-01), Seitoh
patent: 2002/0194557 (2002-12-01), Park

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