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Wafer acceptance testing method and structure of a test key...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer alignment and positioning apparatus for chip testing by vo

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Wafer burn-in and test employing detachable cartridge

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer burn-in and test system

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Wafer burn-in and test system

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Wafer burn-in and test system

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Wafer burn-in and text employing detachable cartridge

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer burn-in cassette and method of manufacturing probe...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer burn-in testing method

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer chuck

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

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Wafer dicing system

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Wafer edge detection system

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Wafer edge-defect detection and capacitive probe therefor

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Wafer handling checker

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

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Wafer holder

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

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Wafer holder for backside viewing, frontside probing on...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer holder for semiconductor applications

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Wafer holder for wafer prober and wafer prober equipped with...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer including test lead connected to ground for testing networ

Electricity: measuring and testing – Plural – automatically sequential tests
Patent

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Wafer indexing system using a grid pattern and coding and orient

Electricity: measuring and testing – Magnetic – Magnetic information storage element testing
Patent

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