Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-04-28
1996-07-02
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
257 48, 3241581, 324765, 437 8, G01R 3128, H01L 2166
Patent
active
055326145
ABSTRACT:
An interconnection system and method of testing and performing burn-in of semiconductor devices prior to separation from the semiconductor wafer on which the devices are formed includes forming interconnection layers of contacts and conductors over the devices and then testing and performing burn-in on the devices. Faulty devices are disconnected from the conductors prior to performing additional test and burn-in. The interconnections are removed prior to separating the device on the wafer, and prior to further possible tests and packaging.
REFERENCES:
patent: 3702025 (1972-11-01), Archer
patent: 3803483 (1974-04-01), McMahon, Jr.
patent: 3835530 (1974-09-01), Kilby
patent: 3849872 (1974-11-01), Hubacher
patent: 4281449 (1981-08-01), Ports et al.
patent: 4356379 (1982-10-01), Graeme
patent: 4426773 (1984-01-01), Hargis
patent: 4467400 (1984-08-01), Stopper
patent: 4611385 (1986-09-01), Forrest et al.
patent: 4628590 (1986-12-01), Udo et al.
patent: 4755750 (1988-07-01), Leuschner
patent: 4801869 (1989-01-01), Sprogis
patent: 4937203 (1990-06-01), Eichelberger et al.
patent: 4956602 (1990-09-01), Parrish
patent: 4961053 (1990-10-01), Krug
patent: 5037771 (1991-08-01), Lipp
patent: 5059899 (1991-10-01), Farnworth et al.
patent: 5241266 (1993-08-01), Ahmad et al.
patent: 5294776 (1994-03-01), Furuyama
"Wafer Burn-In Isolation Circuit", IBM Technical Disclosure Bulletin, vol. 32, No. 6B, Nov. 1989, New York, pp. 442-443.
Brady III W. James
Donaldson Richard L.
Karlsen Ernest F.
Texas Instruments Incorporated
LandOfFree
Wafer burn-in and test system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Wafer burn-in and test system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wafer burn-in and test system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1509357