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Wafer inspecting system

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Wafer inspection device and wafer inspection method

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer inspection method of charging wafer with a charged...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer inspection system

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Wafer integrated plasma probe assembly array

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer integrated plasma probe assembly array

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer keys for wafer probe alignment

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Wafer level burn-in and electrical test system and method

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer level burn-in and electrical test system and method

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer level burn-in and test methods

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer level burn-in base unit substrate and assembly

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Wafer level burn-in system

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Wafer level burn-in using light as the stimulating signal

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer level dielectric test structure and related method for acc

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Wafer level dynamic burn-in

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer level interposer

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer level interposer

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Wafer level method for probing micromechanical devices

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Wafer level reliability contact test structure and method

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent

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Wafer level system for producing burn-in/screen, and...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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