Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1994-02-04
1995-08-22
Karlsen, Ernest F.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324765, 437 8, G01R 3128, G01R 3102
Patent
active
054443660
ABSTRACT:
An interconnection system and method of testing and performing burn-in of semiconductor devices prior to separation from the semiconductor wafer on which the devices are formed includes forming interconnection layers of contacts and conductors over the devices and then testing and performing burn-in on the devices. Faulty devices are disconnected from the conductors prior to performing additional test and burn-in. The interconnections are removed prior to separating the device on the wafer, and prior to further possible tests and packaging.
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"Wafer Burn-In Isolation Circuit", IBM Technical Disclosure Bulletin, vol. 32, No. 6B, Nov. 1989, New York, pp. 442-443.
Brady III W. James
Donaldson Richard L.
Karlsen Ernest F.
Texas Instruments Incorporated
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