Wafer chuck

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Reexamination Certificate

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Details

C324S758010

Reexamination Certificate

active

07411384

ABSTRACT:
A wafer chuck is provided with a plurality of pins which protrude and retreat in a plurality of through holes formed in a vertical direction on a mounting table, and an ascending/descending mechanism for ascending and descending the pins. The wafer chuck receives a wafer by protruding the pins from the mounting plane of the mounting table. On each upper end surface of the pin, a receiving surface part is provided for substantially not making a gap between the pin and each of the corresponding through holes and a mechanism for aligning the receiving surface part with the mounting surface is provided.

REFERENCES:
patent: 5605844 (1997-02-01), Oki et al.
patent: 6485248 (2002-11-01), Taylor, Jr.
patent: 6612021 (2003-09-01), Taniguchi et al.
patent: 2003/0160401 (2003-08-01), Kang et al.
patent: 2005/0142815 (2005-06-01), Miyazaki et al.
patent: 1 197 988 (2002-04-01), None
patent: 53-78173 (1978-07-01), None
patent: 7-302830 (1995-11-01), None
patent: 8-330372 (1996-12-01), None
patent: 11-238770 (1999-08-01), None
patent: 2002-198418 (2002-07-01), None
patent: 2003-66109 (2003-03-01), None
“virtually.” The American Heritage® Dictionary of the English Language, Fourth Edition. Houghton Mifflin Company, 2004. Jun. 27, 2007. <Dictionary.com http://dictionary.reference.com/browse/virtually>.

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