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Selected: I

I-V Curve tracer employing parametric sampling

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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I.F. calibration system

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent

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IC analysis involving logic state mapping in a SOI die

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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IC analysis system and electron beam probe system and fault isol

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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IC Analysis system and electron beam probe system and fault isol

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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IC analysis system and electron beam probe system and fault isol

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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IC carrier capable of loading ICs of different sizes thereon

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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IC carrier for use with an IC handler

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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IC chip test circuit for high frequency integrated circuits

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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IC chip test socket with double-ended spring biased contacts

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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IC chip tester with heating element for preventing condensation

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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IC component test socket assembly having error protection...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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IC Device burn-in method and apparatus

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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IC device contactor

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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IC device inspection apparatus

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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IC device temperature control system and IC device...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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IC device under test temperature control fixture

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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IC engine cylinder output power measurement apparatus by monitor

Electricity: measuring and testing – Internal-combustion engine ignition system or device
Patent

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IC fault analysis system having charged particle beam tester

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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IC fault location tracing apparatus and method

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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