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Method and apparatus for de-embedding on-wafer devices

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Method and apparatus for describing components adapted for...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Method and apparatus for implementing communication between...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Method and apparatus for testing programmable integrated...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Method and apparatus for verifying integrated circuit design...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Method and system for generating design constraints

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Method and system for implementing cached parameterized cells

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Method and system for performing statistical leakage...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Method and system for screening nets in a post-layout...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Method and system for simulating state retention of an RTL...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Method and system for testing bit failures in array elements...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Method for compensation of process-induced performance...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Method for incorporating pattern dependent effects in...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Method for operating a secure semiconductor IP server to...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Method for testing integrated circuits

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Method of correlating silicon stress to device instance...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Method of estimating resource requirements for a circuit design

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Methods for automatically generating assertions

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Methods for defining evaluation points for optical proximity...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Model-based hardware exerciser, device, system and method...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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