Affinity-based clustering of vectors for partitioning the...

Apparatus and method for calculating fault coverage, and...

Calculating distortion summaries for circuit distortion...

Capacitance modeling

Characterization and reduction of variation for integrated...

Debugging simulation of a circuit core using pattern...

Decoder using a memory for storing state metrics...

Delay fault test quality calculation apparatus, delay fault...

Design tool for charge trapping memory using simulated...

Enhanced verification by closely coupling a structural...

Fault dictionaries for integrated circuit yield and quality...

FPGA circuits and methods considering process variations

IC design estimation using mid-level elements of IP cores

Identifying semiconductor system specification violations

Implementing hierarchical design-for-test logic for modular...

Insertion of error detection circuits based on error...

Method and apparatus for de-embedding on-wafer devices

Method and apparatus for describing components adapted for...

Method and apparatus for implementing communication between...

Method and apparatus for testing programmable integrated...