Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
Reexamination Certificate
2008-09-30
2011-11-29
Lin, Sun (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Testing or evaluating
C716S106000, C716S111000
Reexamination Certificate
active
08069432
ABSTRACT:
A method, system, and computer program product are disclosed for performing statistical leakage power characterization to estimate yield of a circuit in terms of leakage power. According to some approaches, this is performed with consideration of bi-exponential modeling.
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Chang Hongliang
Gerousis Vassilios
Huang Kai-Ti
Zhang Lizheng
Cadence Design Systems Inc.
Lin Sun
Vista IP Law Group LLP
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