Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
Reexamination Certificate
2011-05-24
2011-05-24
Lin, Sun J (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Testing or evaluating
C716S132000
Reexamination Certificate
active
07949985
ABSTRACT:
An automated method for compensating for process-induced variations in threshold voltage and drive current in a MOSFET integrated circuit. The method's first step is selecting a transistor for analysis from the array. The method loops among the transistors of the array as desired. Next the design of the selected transistor is analyzed, including the steps of determining threshold voltage variations induced by layout neighborhood; determining drive current variations induced by layout neighborhood. The method then proceeds by attempting to compensate for any determined variations by varying the length of the transistor gate. The method can further include the step of identifying any shortcoming in compensation by varying contact spacing.
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Lin Xi-Wei
Moroz Victor
Pramanik Dipankar
Singhal Kishore
Haynes Beffel & Wolfeld LLP
Lin Sun J
Memula Suresh
Suzue Kenta
Synopsys Inc.
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