LandOfFree - US Patents - Listing for Active solid-state devices (e.g., transistors, solid-state diode,Including region containing crystal damage

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Buried oxide layer in silicon

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Cleaved silicon substrate active device

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Compound semiconductor device having an ion implanted...

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Defect gettering by induced stress

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Gallium nitride substrate, and gallium-nitride-substrate...

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Gettering regions and methods of forming gettering regions withi

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

High performance gaas devices and method

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Quantum tunneling devices and circuits with...

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Semicoductor device having defect type compound layer between si

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Semiconductor and semiconductor substrate, method of...

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Semiconductor chip including a substrate and multilayer part

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Semiconductor device and a method for manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Semiconductor device and fabrication method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Semiconductor device and manufacturing method therefor

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Semiconductor device and method of manufacturing the same with s

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Semiconductor device capable of blocking contaminants

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Semiconductor device having defects of deep level generated by e

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Semiconductor device having layers with varying lifetime charact

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Semiconductor device having source and drain regions which inclu